GAO Yong-hong,Zhu Jian-guo,MAO Zhen-cai

( Lanzhou Center of Product Quality Supervision & Inspection of National Land and Natural Resources, Lanzhou 730050, China)

Abstract: Starting from testing work, the application of partial technical index and test methods in nondispersive atomic fluorescence spectrophotometer verification to new high-sensitive and indelligent instruments was discussed, and relative amending proposals were submitted. It was proved to be actual through acute metrological verification. The problems that the method can’t be undertaken or test index was not suitable to the test demands in real work were resolved. It is guaranteed that the instrument can give accurately and impartially analytical results after metrological verification.

Key Words: atomic fluorescence spectrophotometer; metrological verificationb

E-mail: Lzzjg1121@163.com

Analysis and Testing Technology and Instruments, Vol. 18, No. 2, 2012,121-123